For the reduction of man-hours and efficiency improvement of all EMC tests (immunity tests)!
- By establishing criteria for changing to a different semiconductor (IC), we can omit the re-execution of EMC tests associated with semiconductor changes, thereby achieving a reduction in man-hours.
- By conducting DPI tests in the front-loading phase of product development, we can select semiconductors with high EMC resistance and anticipate a reduction in man-hours for EMC countermeasures.
The DPI immunity testing method is an immunity evaluation method standardized for semiconductors (IC) by IEC standards. This test involves directly injecting RF interference power into the IC power supply on a test board equipped with the IC being evaluated, assessing the immunity resistance. The test requires gradually increasing the test level (power) for each test frequency and confirming the performance of the IC at each stage. Additionally, it is necessary to record the state of any malfunctions that occur, which is very labor-intensive and time-consuming. The DPI immunity testing system from the Noise Research Institute consistently performs everything from test execution to malfunction determination, making it a groundbreaking automation system that reduces testing time and the effort required from testers.